JIS Z Test methods for flat pallets (FOREIGN STANDARD). Available for Subscriptions. Content Provider Japanese Industrial Standards [JIS]. Standard (JIS Z ) was performed. From the obtained results, the possibility of practical application was exam- ined. Moreover, the manufacturing process of. JIS Z – JIS Z Test methods for flat pallets. Publication date: ; Original language: English. Please select.
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For the system in figure B.
In such a case, stress is applied locally to the device and the life or the withstanding limit of the device depends on its weak point. A mask defect can be detected at the same level of expectation at the inspection area t and jiw the number of inspection cycles x figure B.
The reaction rate K using this model is given by the following expression: If the sampled device is not returned non-replacementwe will have a hypergeometric distribution. For ease of understanding we have chosen “failure” and “no failure” for results 1 and 2respectively. We can, however, make a x about the state function f X and the characteristic value X that defines the state.
Let us assume that a given lot of semiconductor devices are storage tested at temperature T. For example, if we say that a given semiconductor device has a failure rate of 10 FIT, this means that one device fails for every component hours.
MTBF known after the life of equipment is of no practical use. This occurs in the case of a surge pulse withstand or mechanical impact test.
JIS Z – Test methods for flat pallets (FOREIGN STANDARD)
It is important to note that N no longer denotes the number of tests of Bernoulli trial due to the approximation of the binomial probability distribution to 002 Poisson distribution. Single sampling 2 1.
Moreover, we consider the system in figure B. We cannot expect that there will be no collision for some time since one has just occurred.
A.1 AQL Sampling Table
Different ways are available for sampling n devices from N devices. Here we assume that the phenomenon does not occur twice or more at the same instant, and further that the probability of the phenomenon occurring is constant.
The Gamma distribution is a failure probability density function if failure occurrence is considered to follow the Poisson jos. Let us assume that the device will fail when the characteristic value changes to XL.
JIS Z 0602:1988
This is because the denominator of the defining expression equation IX component hours does not refer to any particular device. The lot is acccepted when failures are grater than Ac but less then Re. This is consistent with the fact that the geometric and exponential distributions are discrete and continuous distributions, respectively IX The parameter is the value of m.
This is known as consumer’s risk.
A.1 AQL Sampling Table
The AQL plan measures the lot whose fraction defective is p1 as having the lowest acceptable quality level. Detailed discussions of the Poisson distribution are given below. To serve as jid example, consider the life L in equation IX The reliability function R t for this system is given by the Poisson partial sum.
When equipment can be repaired by renewing a failed device, the mean value of the interval that operation is jiw between occurrences of failures is know jks the MTBF Mean Time Between Failures.
The Japan society of machinery water vapor tables new edition Note: This discrete model is termed the Bernoulli trial or sampling. Chapter 5 – Basic Concepts of Probability. By considering the probability of detecting the first failure at time t, the relation jiw exponential and geometric distributions can be identified. The number of samples is determined according to the limits of the binomial distribution indexes. The double exponential distribution is suitable for analysis of such kinds of phenomena.
Such a system is known as a series system of redundancy of 0 figure B.